Transmission electron microscope (TEM) cables. Inner cables within a TEM in a research laboratory. This microscopy technique uses a beam of electrons which is transmitted through an ultra-thin slice of the specimen being studied. Photographed in 2013, at the Binnig and Rohrer Nanotechnology Center at IBM Research-Zurich, Switzerland.

px px dpi = cm x cm = MB
Details

Creative#:

TOP14051563

Source:

達志影像

Authorization Type:

RM

Release Information:

須由TPG 完整授權

Model Release:

N/A

Property Release:

No

Right to Privacy:

No

Same folder images:

Same folder images